Publication detail

Reduction of Test Vectors Number based on Parasitic Capacity Extraction of Scan Chain Wires

BARTOŠ, P. KOTÁSEK, Z.

Original Title

Reduction of Test Vectors Number based on Parasitic Capacity Extraction of Scan Chain Wires

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

In this paper, method for scan chain optimisation performed after physical layout is presented. It is shown how the method can be used to decrease the number of test vectors. The principles of the method are based on parasitic capacity extraction, eliminating some bridging faults in the physical layout and subsequent reduction of the number of test vectors needed to test the circuit. The method was verified on circuits from benchmark set, experimental results are provided and discussed. It is expected that the method can be used in mass production of electronic components.

Keywords

scan chain, reorganization, reordering, test, vector, bridge

Authors

BARTOŠ, P.; KOTÁSEK, Z.

RIV year

2012

Released

3. 10. 2012

Publisher

Faculty of Electrical Engineering and Informatics, University of Technology Košice

Location

Košice

ISBN

978-80-8143-049-7

Book

Proceedings of CSE 2012 International Scientific Conference on Computer Science and Engineering

Pages from

162

Pages to

169

Pages count

8

URL

https://www.fit.vut.cz/research/publication/10033/

BibTex

@inproceedings{BUT96976,
  author="Pavel {Bartoš} and Zdeněk {Kotásek}",
  title="Reduction of Test Vectors Number based on Parasitic Capacity Extraction of Scan Chain Wires",
  booktitle="Proceedings of CSE 2012 International Scientific Conference on Computer Science and Engineering",
  year="2012",
  pages="162--169",
  publisher="Faculty of Electrical Engineering and Informatics, University of Technology Košice",
  address="Košice",
  isbn="978-80-8143-049-7",
  url="https://www.fit.vut.cz/research/publication/10033/"
}

Documents

Proceeding_CSE_2012.pdf