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TRUHLÁŘ, M. KRUML, T. KUBĚNA, I. PETRÁČKOVÁ, K. NÁHLÍK, L.
Original Title
Determination of mechanical properties from microcompression test
Type
conference paper
Language
English
Original Abstract
This paper describes a microcompression test of Al - 1.5 wt. % Cu thin film deposited on Si substrate. Microcompression combines the sample preparation with the use of ion focused beam (FIB) with a compression test carried out using nanoindenter. Cylindrical specimens (pillars) were prepared using FIB. The diameter of pillars was about 1.3 microns and their height was about 2 microns (equal to the film thickness). Stress-strain curves of the thin film were obtained. The results depend on crystallographic orientation of pillar. The paper is focused to an attempt to determine as precisely as possible Young modulus of the film using experimental data and finite element modelling.
Keywords
mechanical properties, thin layers, microcompression test
Authors
TRUHLÁŘ, M.; KRUML, T.; KUBĚNA, I.; PETRÁČKOVÁ, K.; NÁHLÍK, L.
RIV year
2012
Released
14. 5. 2012
ISBN
978-80-86246-40-6
Book
Sborník Engineering Mechanics 2012
Pages from
1435
Pages to
1440
Pages count
6
BibTex
@inproceedings{BUT97155, author="Michal {Truhlář} and Tomáš {Kruml} and Ivo {Kuběna} and Klára {Petráčková} and Luboš {Náhlík}", title="Determination of mechanical properties from microcompression test", booktitle="Sborník Engineering Mechanics 2012", year="2012", pages="1435--1440", isbn="978-80-86246-40-6" }