Publication detail

Automatic Formal Correspondence Checking of ISA and RTL Microprocessor Description

CHARVÁT, L. SMRČKA, A. VOJNAR, T.

Original Title

Automatic Formal Correspondence Checking of ISA and RTL Microprocessor Description

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

The paper proposes an automated approach with a formal basis designed for checking correspondence between an RTL implementation of a microprocessor and a description of its instruction set architecture (ISA). The goals of the approach are to find bugs not discovered by functional verification, to minimize user intervention in the verification process, and to provide a developer with practical results within a short period of time. The main idea is to use bounded model checking to check that the output produced by automatically derived RTL and ISA models of a given processor are the same for each instruction and each possible input. Although the approach does not provide full formal verification, experiments with the approach confirm that due to a different way it explores the state space of the design under test, it can find bugs not found by functional verification, and is thus a useful complement to functional verification.

Keywords

automatic formal verification, correspondence checking, ISA, microprocessor, instruction, RTL, bounded model checking

Authors

CHARVÁT, L.; SMRČKA, A.; VOJNAR, T.

RIV year

2012

Released

10. 12. 2012

Publisher

Institute of Electrical and Electronics Engineers

Location

Austin, TX

ISBN

978-1-4673-4441-8

Book

Proceedings of the 13th International Workshop on Microprocessor Test and Verification (MTV 2012)

Pages from

6

Pages to

12

Pages count

6

URL

BibTex

@inproceedings{BUT97556,
  author="Lukáš {Charvát} and Aleš {Smrčka} and Tomáš {Vojnar}",
  title="Automatic Formal Correspondence Checking of ISA and RTL Microprocessor Description",
  booktitle="Proceedings of the 13th International Workshop on Microprocessor Test and Verification (MTV 2012)",
  year="2012",
  pages="6--12",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Austin, TX",
  doi="10.1109/MTV.2012.19",
  isbn="978-1-4673-4441-8",
  url="http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6519727"
}

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