Přístupnostní navigace
E-application
Search Search Close
Publication detail
CHARVÁT, L. SMRČKA, A. VOJNAR, T.
Original Title
Automatic Formal Correspondence Checking of ISA and RTL Microprocessor Description
Type
article in a collection out of WoS and Scopus
Language
English
Original Abstract
The paper proposes an automated approach with a formal basis designed for checking correspondence between an RTL implementation of a microprocessor and a description of its instruction set architecture (ISA). The goals of the approach are to find bugs not discovered by functional verification, to minimize user intervention in the verification process, and to provide a developer with practical results within a short period of time. The main idea is to use bounded model checking to check that the output produced by automatically derived RTL and ISA models of a given processor are the same for each instruction and each possible input. Although the approach does not provide full formal verification, experiments with the approach confirm that due to a different way it explores the state space of the design under test, it can find bugs not found by functional verification, and is thus a useful complement to functional verification.
Keywords
automatic formal verification, correspondence checking, ISA, microprocessor, instruction, RTL, bounded model checking
Authors
CHARVÁT, L.; SMRČKA, A.; VOJNAR, T.
RIV year
2012
Released
10. 12. 2012
Publisher
Institute of Electrical and Electronics Engineers
Location
Austin, TX
ISBN
978-1-4673-4441-8
Book
Proceedings of the 13th International Workshop on Microprocessor Test and Verification (MTV 2012)
Pages from
6
Pages to
12
Pages count
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6519727
BibTex
@inproceedings{BUT97556, author="Lukáš {Charvát} and Aleš {Smrčka} and Tomáš {Vojnar}", title="Automatic Formal Correspondence Checking of ISA and RTL Microprocessor Description", booktitle="Proceedings of the 13th International Workshop on Microprocessor Test and Verification (MTV 2012)", year="2012", pages="6--12", publisher="Institute of Electrical and Electronics Engineers", address="Austin, TX", doi="10.1109/MTV.2012.19", isbn="978-1-4673-4441-8", url="http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6519727" }