Publication detail

Time-Domain Finite Elements for Virtual Testing of Electromagnetic Compatibility

ŠEDĚNKA, V. CIGÁNEK, J. KADLEC, P. RAIDA, Z. WIKTOR, M. SARTO, M. GRECO, S.

Original Title

Time-Domain Finite Elements for Virtual Testing of Electromagnetic Compatibility

Type

journal article in Web of Science

Language

English

Original Abstract

The paper presents a time-domain finite-element solver developed for simulations related to solving electromagnetic compatibility issues. The software is applied as a module integrated into a computational framework developed within a FP7 European project High Intensity Radiated Field – Synthetic Environment (HIRF SE) able to simulate a large class of problems. In the paper, the mathematical formulation is briefly presented, and special emphasis is put on the user point of view on the simulation tool-chain. The functionality is demonstrated on the computation of shielding effectiveness of two composite materials. Results are validated through experimental measurements and agreement is confirmed by automatic feature selective algorithms.

Keywords

Amelet-HDF, electromagnetic compatibility (EMC), high intensity radiated field synthetic environment (HIRF SE), shielding effectiveness (SE), time domain finite elements (TDFE), composite materials.

Authors

ŠEDĚNKA, V.; CIGÁNEK, J.; KADLEC, P.; RAIDA, Z.; WIKTOR, M.; SARTO, M.; GRECO, S.

RIV year

2013

Released

1. 4. 2013

Publisher

SPOLECNOST PRO RADIOELEKTRONICKE INZENYRSTVI, CZECH TECHNICAL UNIVERSITY, DEPT OF ELECTROMAGNETIC FIELD

Location

TECHNICKA 2, PRAHA, CZ-16627, CZECH REPUBLIC

ISBN

1210-2512

Periodical

Radioengineering

Year of study

22

Number

1

State

Czech Republic

Pages from

309

Pages to

317

Pages count

9

BibTex

@article{BUT99152,
  author="Vladimír {Šeděnka} and Jan {Cigánek} and Petr {Kadlec} and Zbyněk {Raida} and Michal {Wiktor} and Maria Sabrina {Sarto} and Sandra {Greco}",
  title="Time-Domain Finite Elements for Virtual Testing of Electromagnetic Compatibility",
  journal="Radioengineering",
  year="2013",
  volume="22",
  number="1",
  pages="309--317",
  issn="1210-2512"
}