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VYROUBAL, P.
Original Title
Generation Of Shock Waves In Environmental Scanning Electron Microscope And Their Description
English Title
Type
Paper in proceedings (conference paper)
Original Abstract
Environmental scanning electron microscope (ESEM) is one of the latest trends in microscopic methods. In this microscope, we can observe various types of specimens, es-pecially non-conductive and wet specimens. This is given by high pressure of gas in the specimen chamber. This article deals with computational modelling of pressure conditions and shock waves generation in the scintillation detector of secondary electrons for this type of micro-scope.
English abstract
Keywords
Scintillation detector of secondary electrons, finite element method, upwind computational scheme, shock wave.
Key words in English
Authors
Released
26.04.2013
Publisher
LITERA
Location
Brno
ISBN
978-80-214-4695-3
Book
Student EEICT Proceedings of the 19th conference
Pages from
189
Pages to
193
Pages count
5
BibTex
@inproceedings{BUT99403, author="Petr {Vyroubal}", title="Generation Of Shock Waves In Environmental Scanning Electron Microscope And Their Description", booktitle="Student EEICT Proceedings of the 19th conference", year="2013", number="1", pages="189--193", publisher="LITERA", address="Brno", isbn="978-80-214-4695-3" }