Publication detail

Generation Of Shock Waves In Environmental Scanning Electron Microscope And Their Description

VYROUBAL, P.

Original Title

Generation Of Shock Waves In Environmental Scanning Electron Microscope And Their Description

Type

conference paper

Language

English

Original Abstract

Environmental scanning electron microscope (ESEM) is one of the latest trends in microscopic methods. In this microscope, we can observe various types of specimens, es-pecially non-conductive and wet specimens. This is given by high pressure of gas in the specimen chamber. This article deals with computational modelling of pressure conditions and shock waves generation in the scintillation detector of secondary electrons for this type of micro-scope.

Keywords

Scintillation detector of secondary electrons, finite element method, upwind computational scheme, shock wave.

Authors

VYROUBAL, P.

RIV year

2013

Released

26. 4. 2013

Publisher

LITERA

Location

Brno

ISBN

978-80-214-4695-3

Book

Student EEICT Proceedings of the 19th conference

Edition number

1

Pages from

189

Pages to

193

Pages count

5

BibTex

@inproceedings{BUT99403,
  author="Petr {Vyroubal}",
  title="Generation Of Shock Waves In Environmental Scanning Electron Microscope And Their Description",
  booktitle="Student EEICT Proceedings of the 19th conference",
  year="2013",
  number="1",
  pages="189--193",
  publisher="LITERA",
  address="Brno",
  isbn="978-80-214-4695-3"
}