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ŠKARVADA, P. TOMÁNEK, P. KOKTAVÝ, P. DALLAEVA, D.
Original Title
Microscopic optoelectronic defectoscopy of solar cells
Type
journal article - other
Language
English
Original Abstract
Scanning probe microscopes are powerful tool for micro- or nanoscale diagnostics of defects in crystalline silicon solar cells. Solar cell is a large p-n junction semiconductor device. Its quality is strongly damaged by the presence of defects. If the cell works under low reverse-biased voltage, defects emit a light in visible range. The suggested method combines three different measurements: electric noise measurement, local topography and near-field optical beam induced current and thus provides more complex information. To prove its feasibility, we have selected one defect (truncated pyramid) in the sample, which emitted light under low reverse-biased voltage.
Keywords
solar cell, defect, noise, topography, induced photocurrent
Authors
ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P.; DALLAEVA, D.
RIV year
2013
Released
3. 5. 2013
Publisher
EDP Sciences
Location
Les Ullis, Francie
ISBN
2100-014X
Periodical
EPJ Web of Conferences
Year of study
48
Number
1
State
French Republic
Pages from
Pages to
4
Pages count
URL
https://www.epj-conferences.org/articles/epjconf/abs/2013/09/epjconf_OAM2012_00026/epjconf_OAM2012_00026.html
Full text in the Digital Library
http://hdl.handle.net/11012/193661
BibTex
@article{BUT99870, author="Pavel {Škarvada} and Pavel {Tománek} and Pavel {Koktavý} and Dinara {Sobola}", title="Microscopic optoelectronic defectoscopy of solar cells", journal="EPJ Web of Conferences", year="2013", volume="48", number="1", pages="1--4", doi="10.1051/epjconf/20134800026", issn="2100-014X", url="https://www.epj-conferences.org/articles/epjconf/abs/2013/09/epjconf_OAM2012_00026/epjconf_OAM2012_00026.html" }