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ŠKVARENINA, Ľ. GAJDOŠ, A. MACKŮ, R. ŠKARVADA, P.
Original Title
Detection of microstructural defects in chalcopyrite Cu(In,Ga)Se2 solar cells by spectrally-filtered electroluminescence
Type
conference paper
Language
English
Original Abstract
The aim of this research is to detect and localize microstructural defects by using an electrically excited light emission from a forward/reverse-bias stressed pn-junction in thin-film Cu(In; Ga)Se2 solar cells with metal wrap through architecture. A different origin of the local light emission from intrinsic/extrinsic imperfections in these chalcopyrite-based solar cells can be distinguished by a spectrally-filtered electroluminescence mapping. After a light emission mapping and localization of the defects in a macro scale is performed a micro scale exploration of the solar cell surface by a scanning electron microscope which follows the particular defects obtained by an electroluminescence. In particular, these macroscopic/microscopic examinations are performed independently, then the searching of the corresponding defects in the micro scale is rather difficult due to a diffused light emission obtained from the macro scale localization. Some of the defects accompanied by a highly intense light emission very often lead to a strong local overheating. Therefore, the lock-in infrared thermography is also performed along with an electroluminescence mapping
Keywords
CIGS; chalcopyrite; thin-film; solar cell; microstructural defects; electroluminescence mapping; scanning electron microscope; lock-in infrared thermography
Authors
ŠKVARENINA, Ľ.; GAJDOŠ, A.; MACKŮ, R.; ŠKARVADA, P.
Released
1. 12. 2017
Publisher
SPIE
Location
Bellingham, Washington 98227-0010 USA
ISBN
9781510617025
Book
Photonics, Devices, and Systems VII
0277-786X
Periodical
Proceedings of SPIE
Year of study
10603
State
United States of America
Pages from
1
Pages to
7
Pages count
URL
http://dx.doi.org/10.1117/12.2286841
BibTex
@inproceedings{BUT138627, author="Ľubomír {Škvarenina} and Adam {Gajdoš} and Robert {Macků} and Pavel {Škarvada}", title="Detection of microstructural defects in chalcopyrite Cu(In,Ga)Se2 solar cells by spectrally-filtered electroluminescence", booktitle="Photonics, Devices, and Systems VII", year="2017", journal="Proceedings of SPIE", volume="10603", pages="1--7", publisher="SPIE", address="Bellingham, Washington 98227-0010 USA", doi="10.1117/12.2286841", isbn="9781510617025", issn="0277-786X", url="http://dx.doi.org/10.1117/12.2286841" }