Publication detail

The Possibility of Capturing Shock Waves by Computer Simulation in Environmental Scanning Electron Microscope

VYROUBAL, P.

Original Title

The Possibility of Capturing Shock Waves by Computer Simulation in Environmental Scanning Electron Microscope

Type

journal article - other

Language

English

Original Abstract

Environmental scanning electron microscope (ESEM) is one of the latest trends in microscopic methods. In this microscope, we can observe various types of specimens, especially non-conductive and wet specimens. This is given by high pressure of gas in the specimen chamber. The evaluation of pressure on the secondary electrons trajectory is one of the important parameter in design of scintillation detector of secondary electrons. This article deals with computational modelling of pressure conditions and shock waves generation in the scintillation detector of secondary electrons for this type of microscope.

Keywords

Shock wave, scintilation detector, simulation

Authors

VYROUBAL, P.

RIV year

2013

Released

18. 11. 2013

ISBN

1802-4564

Periodical

ElectroScope - http://www.electroscope.zcu.cz

Year of study

2013

Number

5

State

Czech Republic

Pages from

1

Pages to

5

Pages count

5

BibTex

@article{BUT103128,
  author="Petr {Vyroubal}",
  title="The Possibility of Capturing Shock Waves by Computer Simulation in Environmental Scanning Electron Microscope",
  journal="ElectroScope - http://www.electroscope.zcu.cz",
  year="2013",
  volume="2013",
  number="5",
  pages="1--5",
  issn="1802-4564"
}