Publication detail

Photoelectric Characterization of Thin Vacuum Deposited Diphenyl-Diketo-Pyrrolopyrroles Films

ZHIVKOV, I. GEORGIEV, P. HONOVÁ, J. ANGELOV, G. HEINRICHOVÁ, P. ANDONOVA, A. VALA, M. RUSEV, R. TAKOV, T. WEITER, M. HRISTOV, M.

Original Title

Photoelectric Characterization of Thin Vacuum Deposited Diphenyl-Diketo-Pyrrolopyrroles Films

Type

conference paper

Language

English

Original Abstract

ITO|active material|Al structures with active diphenyl-diketopyrrolopyrroles (DPP) films of about 150 nm thicknesses were prepared by vacuum deposition and encapsulated in an inert atmosphere. The surface morphology of the fabricated thin films was studied by SEM imaging, which revealed formation of grains with size of about 200-500 nm. Photoelectric characterization was carried out. Dark current measurements follow non-linear characteristics, with contact barrier of about 0.2 Vwere found. Photocurrent of almost two orders of magnitude higher than the dark current was obtained under an illumination of monochromatic light. Further increase of the photocurrent could be achieved by optimization of the solar cell structure.

Keywords

thin film vacuum deposition, diphenyl-diketopyrrolopyrroles, photoelectrical measurements

Authors

ZHIVKOV, I.; GEORGIEV, P.; HONOVÁ, J.; ANGELOV, G.; HEINRICHOVÁ, P.; ANDONOVA, A.; VALA, M.; RUSEV, R.; TAKOV, T.; WEITER, M.; HRISTOV, M.

RIV year

2014

Released

12. 5. 2014

Publisher

IEEE

ISBN

978-1-4799-5296-0

Book

29th INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL 2014)

Pages from

223

Pages to

226

Pages count

4

URL

http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6842127&tag=1

BibTex

@inproceedings{BUT111872,
  author="ZHIVKOV, I. and GEORGIEV, P. and HONOVÁ, J. and ANGELOV, G. and HEINRICHOVÁ, P. and ANDONOVA, A. and VALA, M. and RUSEV, R. and TAKOV, T. and WEITER, M. and HRISTOV, M.",
  title="Photoelectric Characterization of Thin Vacuum Deposited Diphenyl-Diketo-Pyrrolopyrroles Films",
  booktitle="29th INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL 2014)",
  year="2014",
  pages="223--226",
  publisher="IEEE",
  doi="10.1109/MIEL.2014.6842127",
  isbn="978-1-4799-5296-0",
  url="http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6842127&tag=1"
}