Publication detail

The Comparison between Noise Spectroscopy and LBIC

VANĚK, J., BRZOKOUPIL, V., VAŠÍČEK, T., KAZELLE, J., CHOBOLA, Z., BAŘINKA, R.

Original Title

The Comparison between Noise Spectroscopy and LBIC

Type

conference paper

Language

English

Original Abstract

The noise spectroscopy and LBIC are a pair of the useful methods to provide a non-destructive characterization on semiconductor materials and devices. The actual reliability of electronic devices is usually lower than the maximum theoretical value of reliability, depending on the attained manufacture level. It may be due to irregularities in manufacturing processes. The defects are the natural sources of the excess current and excess noise and they are responsible for the change of several measurable quantities. LBIC measurement for solar cell local characterization has been developed and tested on mono-crystalline Si solar cells. A solar cell is illuminated by a focused laser. The response (current or potential) of the solar cell is measured at fixed conditions (during scanning). We have studied two groups of silicon solar cells: good and wrong standard parameters of solar cells. In this part we describe our study of comparison between noise spectroscopy and LBIC.

Keywords

LBIC, noise, spectroscopy, non-destructive, solar

Authors

VANĚK, J., BRZOKOUPIL, V., VAŠÍČEK, T., KAZELLE, J., CHOBOLA, Z., BAŘINKA, R.

RIV year

2004

Released

1. 1. 2004

Publisher

MSD

Location

Brno

ISBN

80-214-2701-9

Book

The 11th Electronic Devices and Systems Conference

Pages from

454

Pages to

457

Pages count

4

BibTex

@inproceedings{BUT11200,
  author="Jiří {Vaněk} and Vladimír {Brzokoupil} and Tomáš {Vašíček} and Jiří {Kazelle} and Zdeněk {Chobola} and Radim {Bařinka}",
  title="The Comparison between Noise Spectroscopy and LBIC",
  booktitle="The 11th Electronic Devices and Systems Conference",
  year="2004",
  pages="4",
  publisher="MSD",
  address="Brno",
  isbn="80-214-2701-9"
}