Publication detail

Low frequency noise and I-V characteristic as characterization tools for 2.3 microM CW GaSb based LASER diodes

VANĚK, J., BRZOKOUPIL, V., CHOBOLA, Z., ŠIMEČEK, T.

Original Title

Low frequency noise and I-V characteristic as characterization tools for 2.3 microM CW GaSb based LASER diodes

Type

conference paper

Language

English

Original Abstract

Transport and noise characteristic of forward biased 2.3 CW GaSb laser diodes were measured in order to evaluate new technology.

Key words in English

noise spectroscopy, laser diod

Authors

VANĚK, J., BRZOKOUPIL, V., CHOBOLA, Z., ŠIMEČEK, T.

Released

14. 9. 2004

Publisher

Akademické nakladatelství CERM

Location

Czech Republic, Cigháj

ISBN

80-7204-353-6

Book

Research Activities f Physics Departments of Civil Engineering Faculties in the Czech and Slovak Republic

Pages from

184

Pages to

186

Pages count

3

BibTex

@inproceedings{BUT11726,
  author="Jiří {Vaněk} and Vladimír {Brzokoupil} and Zdeněk {Chobola} and Tomáš {Šimeček}",
  title="Low frequency noise and I-V characteristic as characterization tools for 2.3 microM CW GaSb based LASER diodes",
  booktitle="Research Activities f Physics Departments of Civil Engineering Faculties in the Czech and Slovak Republic",
  year="2004",
  pages="3",
  publisher="Akademické nakladatelství CERM",
  address="Czech Republic, Cigháj",
  isbn="80-7204-353-6"
}