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HERENCSÁR, N. KARTCI, A.
Original Title
Resistorless Electronically Tunable Grounded Inductance Simulator Design
Type
conference paper
Language
English
Original Abstract
A new realization of grounded lossless positive inductance simulator (PIS) using simple inverting voltage buffer and unity-gain current follower/inverter (CF±) is reported. Considering the input intrinsic resistance of CF± as useful active parameter, the proposed PIS can be considered as resistorless circuit and it only employs in total 16 Metal-Oxide-Semiconductor (MOS) transistors and a grounded capacitor. The resulting equivalent inductance value of the proposed simulator can be adjusted via change of input intrinsic resistance of CF± by means of its supply voltages. The behavior of the proposed simulator circuit is tested via implementation in voltage-mode 5th-order high-pass filter RLC prototype with Bessel, Butterworth, and Chebyshev I approximation. Theoretical results are verified by SPICE simulations using TSMC 0.18 μm level-7 LO EPI SCN018 CMOS process parameters with ±0.9 V supply voltages.
Keywords
Positive inductance simulator; PIS; grounded lossless circuit; current follower; inverting voltage buffer; 5th-order high-pass filter; RLC prototype; Bessel; Butterworth; Chebyshev I; voltage-mode
Authors
HERENCSÁR, N.; KARTCI, A.
Released
5. 7. 2017
Publisher
IEEE
Location
Barcelona, Spain
ISBN
978-1-5090-3982-1
Book
Proceedings of the 2017 40th International Conference on Telecommunications and Signal Processing (TSP)
Pages from
279
Pages to
282
Pages count
4
URL
http://ieeexplore.ieee.org/document/8075987/
Full text in the Digital Library
http://hdl.handle.net/11012/70222
BibTex
@inproceedings{BUT138294, author="Norbert {Herencsár} and Aslihan {Kartci}", title="Resistorless Electronically Tunable Grounded Inductance Simulator Design", booktitle="Proceedings of the 2017 40th International Conference on Telecommunications and Signal Processing (TSP)", year="2017", pages="279--282", publisher="IEEE", address="Barcelona, Spain", doi="10.1109/TSP.2017.8075987", isbn="978-1-5090-3982-1", url="http://ieeexplore.ieee.org/document/8075987/" }