Publication detail

Noise fluctuation changes related to edge deletion of thin-film Cu(In,Ga)Se2 solar cells

ŠKVARENINA, Ľ. MACKŮ, R. ŠKARVADA, P. GAJDOŠ, A. ŠIKULA, J.

Original Title

Noise fluctuation changes related to edge deletion of thin-film Cu(In,Ga)Se2 solar cells

Type

conference paper

Language

English

Original Abstract

Low-frequency noise and I-V characteristics of reverse-biased thin-film chalcopyrite CIGS solar cell with a metal wrap throught architecture were measure were measured in order to evaluate the efficiency of edfe deletion by a fine grinding and polishing. These electrical measurements were supplemented by a a microscale exploration of the edges, electroluminescence mapping, and lock-in IR thermography. Research efforts are related to the local technological as well as purposely induced structure defects investigation.

Keywords

CIGS; defects; 1/f noise; low-frequency noise; dark current–voltage; SEM; electroluminescence; lock-in thermography

Authors

ŠKVARENINA, Ľ.; MACKŮ, R.; ŠKARVADA, P.; GAJDOŠ, A.; ŠIKULA, J.

Released

20. 7. 2017

Publisher

Institute of Electrical and Electronics Engineers ( IEEE )

Location

Proceedings of a meeting held 20-23 June 2017, Vilnius, Lithuania

ISBN

978-1-5090-2761-3

Book

2017 International Conference on Noise and Fluctuations (ICNF)

Edition number

1

Pages from

1

Pages to

4

Pages count

4

URL

http://ieeexplore.ieee.org/document/7986025/

BibTex

@inproceedings{BUT138618,
  author="Ľubomír {Škvarenina} and Robert {Macků} and Pavel {Škarvada} and Adam {Gajdoš} and Josef {Šikula}",
  title="Noise fluctuation changes related to edge deletion of thin-film Cu(In,Ga)Se2 solar cells",
  booktitle="2017 International Conference on Noise and Fluctuations (ICNF)",
  year="2017",
  number="1",
  pages="1--4",
  publisher="Institute of Electrical and Electronics Engineers ( IEEE )",
  address="Proceedings of a meeting held 20-23 June 2017, Vilnius, Lithuania",
  doi="10.1109/ICNF.2017.7986025",
  isbn="978-1-5090-2761-3",
  url="http://ieeexplore.ieee.org/document/7986025/"
}