Přístupnostní navigace
E-application
Search Search Close
Publication detail
TALU, S. SOBOLA, D. SOLAYMANI, S. DALLAEV, R. BRÜSTLOVÁ, J.
Original Title
Scale-dependent Choice of Scanning Rate for AFM Measurements
Type
conference paper
Language
English
Original Abstract
Three samples with different high of topography features were measured at different scanning rate. We also presented statistical and fractal analyses for definition of the surface morphometrics. They can be used for calculation and evaluation of the images' distortion that takes place during scanning rate and proved to be helpful while controlling the measurement. Basing on the results we came to the conclusion that fractal analysis, the statistical surface roughness parameters and AFM may provide us with a deeper understanding of the physical phenomena taking place in the sample-tip interface. This is why, fractal analysis and statistical surface roughness parameters are useful information for the further improvement of calibration system. This approach can be applied for choosing scanning parameters properly, taking into consideration the geometry of the sample and for the microscope calibration by geometrical sizes of features
Keywords
Fractal dimension, Micromorphology, Statistical parameters, Topography
Authors
TALU, S.; SOBOLA, D.; SOLAYMANI, S.; DALLAEV, R.; BRÜSTLOVÁ, J.
Released
18. 7. 2018
Publisher
EStech Transactions on Computer Science and Engineering
ISBN
978-1-60595-065-5
Book
DEStech Transactions on Computer Science and Engineering
2475-8841
Periodical
State
United States of America
Pages from
453
Pages to
459
Pages count
7
URL
http://www.dpi-proceedings.com/index.php/dtcse/article/view/24197
BibTex
@inproceedings{BUT148890, author="Stefan {Talu} and Dinara {Sobola} and Shahram {Solaymani} and Rashid {Dallaev} and Jitka {Brüstlová}", title="Scale-dependent Choice of Scanning Rate for AFM Measurements", booktitle="DEStech Transactions on Computer Science and Engineering", year="2018", journal="DEStech Transactions on Computer Science and Engineering", pages="453--459", publisher="EStech Transactions on Computer Science and Engineering", doi="10.12783/dtcse/cnai2018/24197", isbn="978-1-60595-065-5", issn="2475-8841", url="http://www.dpi-proceedings.com/index.php/dtcse/article/view/24197" }