Publication detail

Key Exchange with PUF in NG-PON2 Networks

HORVÁTH, T. ČLUPEK, V. MÜNSTER, P. OUJEZSKÝ, V.

Original Title

Key Exchange with PUF in NG-PON2 Networks

Type

conference paper

Language

English

Original Abstract

As next generation passive optical networks (XG-PONs) are currently being deployed, the usability and future deployment of next generation PON stage 2 (NG-PON2) are being called into question. This work provides an overview of basic parameters used in generation (stage 2) passive optical networks. The approved recommendations do not include the complete descriptions of these network parameters, but rather the parameters and methods for the distribution and exchange of keys necessary for NG-PON2 communication. This work also summarizes the current state of affairs and proposes a physical unclonable function (PUF) based improvement in the key exchange procedure that takes place between optical line termination (OLT) and optical network unit (ONU). To implement the new key exchange method, it is necessary to define a new physical layer operations, administration and maintenance (PLOAM) message that is derived from the existing one.

Keywords

NG-PON2; security threat; PUF; transmission convergence layer; key exchange

Authors

HORVÁTH, T.; ČLUPEK, V.; MÜNSTER, P.; OUJEZSKÝ, V.

Released

4. 7. 2019

Publisher

IEEE

Location

Budapešť, Maďarsko

ISBN

978-1-7281-1864-2

Book

42nd International Conference on Telecommunications and Signal Processing (TSP)

Pages from

118

Pages to

121

Pages count

4

URL

https://ieeexplore.ieee.org/document/8769082

BibTex

@inproceedings{BUT157621,
  author="Tomáš {Horváth} and Vlastimil {Člupek} and Petr {Münster} and Václav {Oujezský}",
  title="Key Exchange with PUF in NG-PON2 Networks",
  booktitle="42nd International Conference on Telecommunications and Signal Processing (TSP)",
  year="2019",
  pages="118--121",
  publisher="IEEE",
  address="Budapešť, Maďarsko",
  doi="10.1109/TSP.2019.8769082",
  isbn="978-1-7281-1864-2",
  url="https://ieeexplore.ieee.org/document/8769082"
}