Publication detail

International Symposium on Design and Diagnostics of Electronic Circuits and Systems

STAMENKOVIC, Z. BOSIO, A. CSEREY, G. NOVÁK, O. PLESKACZ, W. SEKANINA, L. STEININGER, A. STOJANOVIC, G. STOPJAKOVÁ, V.

Original Title

International Symposium on Design and Diagnostics of Electronic Circuits and Systems

Type

conference paper

Language

English

Original Abstract

The paper is a contribution to the 50th anniversary celebration of the International Test Conference (ITC) and its Global Test Forum (GTF), which honors the geographic breadth of the test community and highlights the global reach of ITC during the past 50 years. It covers the past, present, and future of the International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), a symposium which belongs to prominent test technology related events initiated and supported by the ITC.

Keywords

symposium, DDECS, electronics, circuits, systems

Authors

STAMENKOVIC, Z.; BOSIO, A.; CSEREY, G.; NOVÁK, O.; PLESKACZ, W.; SEKANINA, L.; STEININGER, A.; STOJANOVIC, G.; STOPJAKOVÁ, V.

Released

9. 11. 2019

Publisher

Institute of Electrical and Electronics Engineers

Location

Washington, DC

ISBN

978-1-7281-4823-6

Book

2019 IEEE International Test Conference

Pages from

1

Pages to

4

Pages count

4

URL

https://www.fit.vut.cz/research/publication/12200/

BibTex

@inproceedings{BUT162595,
  author="STAMENKOVIC, Z. and BOSIO, A. and CSEREY, G. and NOVÁK, O. and PLESKACZ, W. and SEKANINA, L. and STEININGER, A. and STOJANOVIC, G. and STOPJAKOVÁ, V.",
  title="International Symposium on Design and Diagnostics of Electronic Circuits and Systems",
  booktitle="2019 IEEE International Test Conference",
  year="2019",
  pages="1--4",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Washington, DC",
  doi="10.1109/ITC44170.2019.9000137",
  isbn="978-1-7281-4823-6",
  url="https://www.fit.vut.cz/research/publication/12200/"
}