Publication detail

Comparison of Two Denoising Techniques to Improve UHF Partial Discharge Localization

HEJTMÁNEK, T. DREXLER, P. STEWART, B. JUDD, M.

Original Title

Comparison of Two Denoising Techniques to Improve UHF Partial Discharge Localization

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

This paper reports on an investigation into the application of denoising techniques to improve the arrival time detection of UHF partial discharge (PD) signals, with the aim of refining the spatial localization of PD in power transformers, gas insulated switchgear, and other systems where partial discharges can occur. Noise reduction methods can be applied to signals from various measurement systems including UHF methods or acoustic emission detection. Most existing measurement systems do not normally apply any sophisticated signal processing to suppress noise in the spatial localization of discharges. This can potentially cause inaccuracies in the location of insulation defects position and may inadvertently misdirect modification or repairs of equipment, maintenance inspection of exposed parts or subsequent servicing operation.

Keywords

partial discharge, localization, Empirical mode decomposition, Wavelet transform, UHF signals

Authors

HEJTMÁNEK, T.; DREXLER, P.; STEWART, B.; JUDD, M.

Released

5. 8. 2020

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Location

Knoxville, TN, USA, USA

ISBN

978-1-7281-5485-5

Book

Electrical Insulation Conference and Electrical Manufacturing & Coil Winding Conference

Pages from

379

Pages to

392

Pages count

4

URL

https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9158689

BibTex

@inproceedings{BUT165212,
  author="Tomáš {Hejtmánek} and Petr {Drexler} and Brian G {Stewart} and Martin D {Judd}",
  title="Comparison of Two Denoising Techniques to Improve UHF Partial Discharge Localization",
  booktitle="Electrical Insulation Conference and Electrical Manufacturing & Coil Winding Conference",
  year="2020",
  pages="379--392",
  publisher="Institute of Electrical and Electronics Engineers (IEEE)",
  address="Knoxville, TN, USA, USA",
  doi="10.1109/EIC47619.2020.9158689",
  isbn="978-1-7281-5485-5",
  url="https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9158689"
}