Publication detail

Graphene field-effect transistor properties modulation via mechanical strain induced by micro-cantilever

BRODSKÝ, J.

Original Title

Graphene field-effect transistor properties modulation via mechanical strain induced by micro-cantilever

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

This work presents a new method, which enables the electrical characterization of graphene monolayer with induced mechanical strain. The device is a combination of two dimensional field effect transistor (2DFET) and a MEMS cantilever, both of which can be used to alter graphene properties. The first method applies external electric field to the graphene monolayer. The second method is based on mechanical bending of the cantilever by external force, which induces mechanical strain in the characterized layer. By sweeping the gate voltage (VGS) in range from – 50 V to + 50 V and measuring the current between drain and source (IDS) with fixed drain source voltage (VDS) at 1 V, Dirac point of graphene is found at ≈ 9.3 V of VGS. After bending of the cantilever, the sweep is performed again. The induced strain shifts the position of the Dirac point by ≈ 1.3 V to VGS = 8 V. Because the fabrication process is compatible with silicon technology, this method brings new possibilities in graphene strain engineering.

Keywords

graphene, Dirac point, MEMS, FET, cantilever, mechanical strain

Authors

BRODSKÝ, J.

Released

27. 4. 2021

Publisher

Brno University of Technology, Faculty of Electrical Engineering and Communication

Location

Brno

ISBN

978-80-214-5943-4

Book

Proceedings II of the 27th Conference STUDENT EEICT selected papers

Edition

1

Pages from

81

Pages to

84

Pages count

4

URL

https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2021_sbornik_2_v3_DOI.pdf

BibTex

@inproceedings{BUT171865,
  author="Jan {Brodský}",
  title="Graphene field-effect transistor properties modulation via mechanical strain induced by micro-cantilever",
  booktitle="Proceedings II of the 27th Conference STUDENT EEICT selected papers",
  year="2021",
  series="1",
  pages="81--84",
  publisher="Brno University of Technology, Faculty of Electrical Engineering and Communication",
  address="Brno",
  doi="10.13164/eeict.2021.81",
  isbn="978-80-214-5943-4",
  url="https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2021_sbornik_2_v3_DOI.pdf"
}