Publication detail

Synthetic Data in Quantitative Scanning Probe Microscopy

NEČAS, D. KLAPETEK, P.

Original Title

Synthetic Data in Quantitative Scanning Probe Microscopy

Type

journal article in Web of Science

Language

English

Original Abstract

Synthetic data are of increasing importance in nanometrology. They can be used for development of data processing methods, analysis of uncertainties and estimation of various measurement artefacts. In this paper we review methods used for their generation and the applications of synthetic data in scanning probe microscopy, focusing on their principles, performance, and applicability. We illustrate the benefits of using synthetic data on different tasks related to development of better scanning approaches and related to estimation of reliability of data processing methods. We demonstrate how the synthetic data can be used to analyse systematic errors that are common to scanning probe microscopy methods, either related to the measurement principle or to the typical data processing paths.

Keywords

nanometrology; data synthesis; scanning probe microscopy

Authors

NEČAS, D.; KLAPETEK, P.

Released

1. 6. 2021

Publisher

MDPI

Location

BASEL

ISBN

2079-4991

Periodical

Nanomaterials

Year of study

11

Number

7

State

Swiss Confederation

Pages from

1

Pages to

26

Pages count

26

URL

https://www.mdpi.com/2079-4991/11/7/1746

Full text in the Digital Library

http://hdl.handle.net/11012/203015

BibTex

@article{BUT173174,
  author="David {Nečas} and Petr {Klapetek}",
  title="Synthetic Data in Quantitative Scanning Probe Microscopy",
  journal="Nanomaterials",
  year="2021",
  volume="11",
  number="7",
  pages="1--26",
  doi="10.3390/nano11071746",
  issn="2079-4991",
  url="https://www.mdpi.com/2079-4991/11/7/1746"
}