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MISIUREV, D.
Original Title
Lithographic thin–film structures based on Electrochromic materials: Case study by scanning probe microscopy
Type
conference paper
Language
English
Original Abstract
The main object of this study will be based on producing and characterization of lithographic thin–film structures produced based electrochromic materials. Atomic force microscopy will be used as a main method of evaluation the morphology of lithographic structures. The optical properties of eslectrochromic materials will be analyze using scanning near–field optical microscopy by applying different electrical potential.
Keywords
AFM, SNOM, electrochromic materials, thin–films.
Authors
Released
26. 4. 2022
Publisher
Brno University of Technology, Faculty of Electrical Engineering and Communication
Location
Brno
ISBN
978-80-214-6029-4
Book
Proceedings I of the 28th Conference STUDENT EEICT 2022 General Papers
Edition
1
Pages from
409
Pages to
414
Pages count
6
URL
https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2022_sbornik_1_v2.pdf
BibTex
@inproceedings{BUT178768, author="Denis {Misiurev}", title="Lithographic thin–film structures based on Electrochromic materials: Case study by scanning probe microscopy", booktitle="Proceedings I of the 28th Conference STUDENT EEICT 2022 General Papers", year="2022", series="1", pages="409--414", publisher="Brno University of Technology, Faculty of Electrical Engineering and Communication", address="Brno", isbn="978-80-214-6029-4", url="https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2022_sbornik_1_v2.pdf" }