Publication detail

Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters

Pinder, JW. Major, GH. Baer, DR. Terry, J. Whitten, JE. Cechal, J. Crossman, JD. Lizarbe, AJ. Jafari, S. Easton, CD. Baltrusaitis, J. van Spronsen, MA. Linford, MR.

Original Title

Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters

Type

journal article in Web of Science

Language

English

Original Abstract

Despite numerous tutorials and standards written to the technical community on X-ray photoelectron spectroscopy (XPS), difficulties with data acquisition, analysis, and reporting persist. This work focuses on common errors in XPS that are frequently observed in the scientific literature and their sources. Indeed, this work covers: (i) XPS data collection, initial data analysis, and data presentation, (ii) Handling XPS backgrounds, (iii) Common errors in XPS peak fitting, and (iv) XPS data presentation and reporting. Graphical examples of errors and appropriate ways of handling data and correcting errors are provided. Additional readings are listed for greater in-depth exploration of the subjects discussed.

Keywords

X-ray photoelectron spectroscopy; XPS; Reporting; Data collection; Common errors

Authors

Pinder, JW.; Major, GH.; Baer, DR.; Terry, J.; Whitten, JE.; Cechal, J.; Crossman, JD.; Lizarbe, AJ.; Jafari, S.; Easton, CD.; Baltrusaitis, J.; van Spronsen, MA.; Linford, MR.

Released

1. 2. 2024

Publisher

ELSEVIER

Location

AMSTERDAM

ISBN

2666-5239

Periodical

Applied Surface Science Advances

Year of study

19

Number

100534

State

Kingdom of the Netherlands

Pages count

29

URL

https://www.sciencedirect.com/science/article/pii/S266652392300168X?via%3Dihub

BibTex

@article{BUT188960,
  author="Pinder, JW. and Major, GH. and Baer, DR. and Terry, J. and Whitten, JE. and Cechal, J. and Crossman, JD. and Lizarbe, AJ. and Jafari, S. and Easton, CD. and Baltrusaitis, J. and van Spronsen, MA. and Linford, MR.",
  title="Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters",
  journal="Applied Surface Science Advances",
  year="2024",
  volume="19",
  number="100534",
  pages="29",
  doi="10.1016/j.apsadv.2023.100534",
  issn="2666-5239",
  url="https://www.sciencedirect.com/science/article/pii/S266652392300168X?via%3Dihub"
}