Publication detail

Data Dependent I Path and their Utilisation in DFT

RŮŽIČKA, R.

Original Title

Data Dependent I Path and their Utilisation in DFT

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

This paper describes an algorithm for utilisation of data paths in the digital circuit, in what functional units occur. These paths, called i paths, are used to transport test patterns and responses to them during the test of the circuit. Some functional units have an identity mode conditioned by the presence of concrete data (e.g. zero for an adder) on their inputs. When these dependencies are taken into account, the cost of modifications for testability of the circuit can be significantly reduced.

Keywords

i path, design-for-testability, i mode, data dependent i mode

Authors

RŮŽIČKA, R.

Released

1. 1. 2000

Publisher

Akademické nakladatelství CERM

Location

Brno

ISBN

80-7204-155-X

Book

Sborník prací studentů a doktorandů FEI VUT

Pages from

228

Pages to

230

Pages count

3

BibTex

@inproceedings{BUT191625,
  author="Richard {Růžička}",
  title="Data Dependent I Path and their Utilisation in DFT",
  booktitle="Sborník prací studentů a doktorandů FEI VUT",
  year="2000",
  pages="228--230",
  publisher="Akademické nakladatelství CERM",
  address="Brno",
  isbn="80-7204-155-X"
}