Publication detail

The Unified Approach to Processor Testing

DRÁBEK, V.

Original Title

The Unified Approach to Processor Testing

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

The focus is concentrated on different design for testability approaches being used on current processors as full scan, partial scan, standard boundary scan, and so on. An unified approach to processor testing is being proposed, combining several optimised DFT techniques, formal verification and system-level testing.

Authors

DRÁBEK, V.

Released

1. 1. 1999

Publisher

unknown

Location

Košice-Herlany

ISBN

80-88922-05-4

Book

CE&I, Sci. Conf., Košice-Herlany, Slovakia

Pages from

192

Pages to

195

Pages count

4

BibTex

@inproceedings{BUT192309,
  author="Vladimír {Drábek}",
  title="The Unified Approach to Processor Testing",
  booktitle="CE&I, Sci. Conf., Košice-Herlany, Slovakia",
  year="1999",
  pages="192--195",
  publisher="unknown",
  address="Košice-Herlany",
  isbn="80-88922-05-4"
}