Publication detail
Chybí název
ŠIKULA, J.
Original Title
Chybí název
Type
conference paper
Language
English
Original Abstract
Reliability Indicators for Thin and Thick Film Resistors
Authors
ŠIKULA, J.
RIV year
1999
Released
1. 1. 1999
Publisher
Components Technology Institute, Inc.
Location
Huntsville, USA
ISBN
80-01-0195
Book
CARTS 99
Pages from
292
Pages to
296
Pages count
5
BibTex
@inproceedings{BUT214,
author="Josef {Šikula}",
title="Chybí název",
booktitle="CARTS 99",
year="1999",
pages="5",
publisher="Components Technology Institute, Inc.",
address="Huntsville, USA",
isbn="80-01-0195"
}