Publication detail

Modeling temperature effects on stress-lifetime fatigue curves in the finite-litetime region

KOHOUT, J. VĚCHET, S.

Original Title

Modeling temperature effects on stress-lifetime fatigue curves in the finite-litetime region

Type

conference paper

Language

English

Original Abstract

Analysing several families of finite-life fatigue curves of various materials obtained at various temperatures, the following general trends have been observed: (i) a decrease in temperature leads to a shift of the curves towards higher strength values, (ii) the slope of the curves at different temperatures is approximately constant, and (iii) if the curves are drawn in log-log scales and absolute Kelvin temperature is ised, the same ratio of temperatures leads approximately to the same shift if fatigue strength values. On the basis of these trends the Basquin equation, which is represented by parallel straight lines in log sigma - lot T fit describing finite-life fatigue curves can be generalized for various temperatures. Deviations from these straight lines are evidence that other degradation mechanisms with different temperature dependences are effective. In the high-temperature region it is most often creep, in the low-temperature region athermal processes of plastic deformation can play a significant role in fatigue failure.

Keywords

fatigue, ADI, modeling temperature

Authors

KOHOUT, J.; VĚCHET, S.

Released

26. 3. 2007

Publisher

Engineering Integrity Society

Location

Held at Queens College, University of Cambridge, UK, 26. - 28. 3. 2007

ISBN

978-0-9544368-1-0

Book

FATIGUE 2007

Pages from

42

Pages to

42

Pages count

1

BibTex

@inproceedings{BUT22154,
  author="Jan {Kohout} and Stanislav {Věchet}",
  title="Modeling temperature effects on stress-lifetime fatigue curves in the finite-litetime region",
  booktitle="FATIGUE 2007",
  year="2007",
  pages="42--42",
  publisher="Engineering Integrity Society",
  address="Held at Queens College, University of Cambridge, UK, 26. - 28. 3. 2007",
  isbn="978-0-9544368-1-0"
}