Publication detail

FITTest_BENCH06: A New Set of Benchmark Circuits Reflecting Testability Properties

PEČENKA, T. KOTÁSEK, Z. SEKANINA, L.

Original Title

FITTest_BENCH06: A New Set of Benchmark Circuits Reflecting Testability Properties

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

In the paper, the FITTest_BENCH06 set of synthetic benchmark circuits is presented for the evaluation of diagnostic methods and tools. The structure of benchmark circuits together with their diagnostic properties is described. The set consists of 31 circuits at various levels of complexity (2000, 10000, 28000, 100000, 150000 and 300000 gates). Four circuits with different diagnostic properties are available for each level of circuit complexity (fault coverage is approx. 0%, 33%, 66% and 100%). The benchmark circuits are available both at the register transfer level and the gate level. In addition to the benchmark set, a method is described that was used to develop benchmark circuits with required complexity and diagnostic properties.

Keywords

benchmark, synthetic, RTL, testability

Authors

PEČENKA, T.; KOTÁSEK, Z.; SEKANINA, L.

RIV year

2006

Released

25. 4. 2006

Publisher

IEEE Computer Society

Location

Praha

ISBN

1424401844

Book

Proc. of 2006 IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop

Pages from

285

Pages to

289

Pages count

5

BibTex

@inproceedings{BUT22205,
  author="Tomáš {Pečenka} and Zdeněk {Kotásek} and Lukáš {Sekanina}",
  title="FITTest_BENCH06: A New Set of Benchmark Circuits Reflecting Testability Properties",
  booktitle="Proc. of 2006 IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop",
  year="2006",
  pages="285--289",
  publisher="IEEE Computer Society",
  address="Praha",
  isbn="1424401844"
}