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KOKTAVÝ, P. KOKTAVÝ, B. MACKŮ, R. SADOVSKÝ, P.
Original Title
Noise diagnostics of local defects in solar cells
Type
conference paper
Language
English
Original Abstract
This study deals with the use of noise for solar cells diagnostic purposes. When a high electric field is applied to a PN junction containing some technological imperfections, local breakdowns arises in micro-sized regions, which in turn can lead to the deterioration in quality or destruction of the PN junction. It is therefore advisable to use methods which can indicate the presence of these regions in the junction and make the quality assessment and quantitative description of the tested cells possible.
Keywords
Solar cell, microplasma noise, noise diagnostics
Authors
KOKTAVÝ, P.; KOKTAVÝ, B.; MACKŮ, R.; SADOVSKÝ, P.
RIV year
2007
Released
20. 9. 2007
Publisher
IMAPS CS
Location
Brno
ISBN
978-80-214-3470-7
Book
Proc. of EDS IMAPS CS 2007
Pages from
409
Pages to
413
Pages count
5
BibTex
@inproceedings{BUT25515, author="Pavel {Koktavý} and Bohumil {Koktavý} and Robert {Macků} and Petr {Sadovský}", title="Noise diagnostics of local defects in solar cells", booktitle="Proc. of EDS IMAPS CS 2007", year="2007", pages="409--413", publisher="IMAPS CS", address="Brno", isbn="978-80-214-3470-7" }