Publication detail

Testability Enhancement of Multilevel Designs Guided by Testability Analysis Method

STRNADEL, J.

Original Title

Testability Enhancement of Multilevel Designs Guided by Testability Analysis Method

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

In the paper, multilevel extension of previously published register-transfer level testability analysis method is presented. It is illustrated how libraries and net-lists of multilevel designs can be described in special language developed for the purpose, how the method can be linked up to commercial electronic design automation tools and how information offered by the method can be utilized for guidance during testability enhancement of digital designs.

Keywords

digital, circuit, design, testability, multilevel, enhancement, guidance

Authors

STRNADEL, J.

RIV year

2008

Released

2. 6. 2008

Publisher

Brno University of Technology

Location

Brno

ISBN

978-80-214-3717-3

Book

Proceedings of Electronic Devices and Systems IMAPS CS International Conference

Pages from

367

Pages to

372

Pages count

6

URL

https://www.fit.vut.cz/research/publication/8631/

BibTex

@inproceedings{BUT27713,
  author="Josef {Strnadel}",
  title="Testability Enhancement of Multilevel Designs Guided by Testability Analysis Method",
  booktitle="Proceedings of Electronic Devices and Systems IMAPS CS International Conference",
  year="2008",
  pages="367--372",
  publisher="Brno University of Technology",
  address="Brno",
  isbn="978-80-214-3717-3",
  url="https://www.fit.vut.cz/research/publication/8631/"
}