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MACKŮ, R.
Original Title
Extended electrical and thermal properties of single junction silicon solar cells
Type
conference paper
Language
English
Original Abstract
This paper reports an electrical measurement of the single junction solar cells based on silicon technology. Defects of these samples are often local and can result in lower efficiency or shorter solar cell lifetime. Consequently, we can observe many of defects in electric characteristics of solar cells. Measured IV-characteristics and noise signals provide information for defects classification and/or identification. The results of two basic types of the silicon solar cells measurements at very low temperatures are presented in this paper. Used types of solar cells differ above all in the surface texturing and dopand concentration. The cryogenic system is used to accurate setting of temperature with wide range of operating temperatures. The microscopic study of the samples surface is presented, too.
Keywords
Solar cell, noise, breakdown, PN junction, transport mechanisms
Authors
RIV year
2009
Released
10. 4. 2009
Publisher
VUT v Brně
Location
Brno
ISBN
978-80-214-3869-9
Book
Proceedings of the 15th conference Student EEICT 2009
Edition number
1
Pages from
208
Pages to
212
Pages count
5
BibTex
@inproceedings{BUT29146, author="Robert {Macků}", title="Extended electrical and thermal properties of single junction silicon solar cells", booktitle="Proceedings of the 15th conference Student EEICT 2009", year="2009", number="1", pages="208--212", publisher="VUT v Brně", address="Brno", isbn="978-80-214-3869-9" }