Publication detail

MATCHING IN MILLER OTA: CASE STUDY

HÁZE, J. LAŽA, M. BOHRN, M.

Original Title

MATCHING IN MILLER OTA: CASE STUDY

Type

conference paper

Language

English

Original Abstract

The downscaling of device as transistors causes the unpredictability of analog circuit yield. Transistor mismatch is one of the obstacles to achieve high yield. Analog circuit designers usually run simulation to predict the functionality of their circuits. Monte Carlo simulation is often used. If you have offset as crucial parameter than you need to calculate proper sizes of all transistors in blocks, which have influence to offset.

Keywords

Miller OTA

Authors

HÁZE, J.; LAŽA, M.; BOHRN, M.

Released

9. 9. 2009

Publisher

IMAPS CZ/SK

Location

Brno

ISBN

978-80-214-3717-3

Book

Proceedings on 15th International EDS Conference 2008

Pages from

341

Pages to

346

Pages count

5

BibTex

@inproceedings{BUT32417,
  author="Jiří {Háze} and Martin {Laža} and Marek {Bohrn}",
  title="MATCHING IN MILLER OTA: CASE STUDY",
  booktitle="Proceedings on 15th International EDS Conference 2008",
  year="2009",
  pages="341--346",
  publisher="IMAPS CZ/SK",
  address="Brno",
  isbn="978-80-214-3717-3"
}