Publication detail

The Use of Genetic Algorithm to Derive Correlation Between Test Vector and Scan Register Sequences and Reduce Power Consumption

KOTÁSEK, Z. ŠKARVADA, J. STRNADEL, J.

Original Title

The Use of Genetic Algorithm to Derive Correlation Between Test Vector and Scan Register Sequences and Reduce Power Consumption

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

In most of existing approaches, the reorganization of test vector sequence and reordering scan chains registers to reduce power consumption are solved separately, they are seen as independent procedures. In the paper it is shown that a  correlation between these two processes and strong reasons to combine them into one procedure run concurrently exist. Based on this idea, it is demonstrated that search spaces of both procedures can be combined together into a single search space in order to achieve better results during the optimization process. The optimization over the united search space was tested on ISCAS85, ISCAS89 and ITC99 benchmark circuits implemented by means of CMOS primitives from AMI technological libraries. Results presented in the paper show that lower power consumption can be achieved if the correlation is reflected, i.e., if the search space is united rather than divided into separate spaces. At the end of the paper, results achieved by genetic algorithm based optimization are presented, discussed and compared with results of existing methods.

Keywords

test vector, scan chain, low power, power consumption, optimization, genetic algorithm, CMOS, AMI, ordering, correlation

Authors

KOTÁSEK, Z.; ŠKARVADA, J.; STRNADEL, J.

RIV year

2010

Released

1. 9. 2010

Publisher

IEEE Computer Society

Location

Los Alamitos

ISBN

978-0-7695-4171-6

Book

Proceedings of 13th Euromicro Conference on Digital System Design Architectures, Methods and Tools

Pages from

644

Pages to

651

Pages count

8

URL

https://www.fit.vut.cz/research/publication/9342/

BibTex

@inproceedings{BUT35934,
  author="Zdeněk {Kotásek} and Jaroslav {Škarvada} and Josef {Strnadel}",
  title="The Use of Genetic Algorithm to Derive Correlation Between Test Vector and Scan Register Sequences and Reduce Power Consumption",
  booktitle="Proceedings of 13th Euromicro Conference on Digital System Design Architectures, Methods and Tools",
  year="2010",
  pages="644--651",
  publisher="IEEE Computer Society",
  address="Los Alamitos",
  isbn="978-0-7695-4171-6",
  url="https://www.fit.vut.cz/research/publication/9342/"
}