Publication detail

Reliability and Simulation of Lead-Free Solder Joint Behavior in 3D Packaging Structure

NICÁK, M. ŠVECOVÁ, O. ŠANDERA, J. PULEC, J. SZENDIUCH, I.

Original Title

Reliability and Simulation of Lead-Free Solder Joint Behavior in 3D Packaging Structure

Type

conference paper

Language

English

Original Abstract

This paper deals with behavior of lead-free solder joint applied in 3D electronic packaging structure. There are plenty of factors which influences reliability and life-time of solder compound connection. Type of substrates, selection of materials and process arrangement are the main areas to investigate. The content consists from three main parts. The first deals with introduction of designed test pattern, material, and process arrangement and applied testing methods. Second part continues with ANSYS software simulation of solder interconnections during thermo-mechanical stress tests and third part is aimed to experimental evaluation of results in the comparison to simulated results.

Keywords

3D Packaging, ANSYS, Lead-free, Reliability, Solder joint

Authors

NICÁK, M.; ŠVECOVÁ, O.; ŠANDERA, J.; PULEC, J.; SZENDIUCH, I.

RIV year

2011

Released

12. 1. 2011

Publisher

Trans Tech Publications

Location

Švýcarsko

ISBN

978-3-03785-006-0

Book

Key Engineering Materials Vol. 465 (2011)

ISBN

1013-9826

Periodical

Key Engineering Materials (print)

Year of study

465

Number

491

State

Swiss Confederation

Pages from

491

Pages to

494

Pages count

4

URL

http://www.scientific.net/KEM.465.491

BibTex

@inproceedings{BUT36015,
  author="Michal {Nicák} and Olga {Švecová} and Josef {Šandera} and Jiří {Pulec} and Ivan {Szendiuch}",
  title="Reliability and Simulation of Lead-Free Solder Joint Behavior in 3D Packaging Structure",
  booktitle="Key Engineering Materials Vol. 465 (2011)",
  year="2011",
  journal="Key Engineering Materials (print)",
  volume="465",
  number="491",
  pages="491--494",
  publisher="Trans Tech Publications",
  address="Švýcarsko",
  isbn="978-3-03785-006-0",
  issn="1013-9826",
  url="http://www.scientific.net/KEM.465.491"
}