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Publication detail
PŘIKRYL, R., SALYK, O., KŘÍPAL, L., ČECH, V.
Original Title
New Scratch Tester Developed for Plasma Polymer Characterization
Type
journal article - other
Language
English
Original Abstract
A fully PC-controlled scratch tester was developed for testing of adhesion between the film and the substrate. The Rockwell ball or the diamond tip is driven over the film surface to produce a scratch in this film. The load on the ball (tip) is linearly increased and the value of the load, at which adhesion failure is detected, is known as the critical load between the film and the substrate. The apparatus was constructed and optimized for polymer films with respect to the force range and sensitivity. The plot of normal and lateral force is recorded and analyzed in order to obtain the critical load value. The optical polarizing and the atomic force microscopy enabled to analyze the scratch path.
Key words in English
adhesion, scratch, thin film, plasma polymer
Authors
Released
1. 1. 2002
ISBN
0011-4626
Periodical
Czechoslovak Journal of Physics
Year of study
2002
Number
52 D (2002)
State
Czech Republic
Pages from
824
Pages to
828
Pages count
5
BibTex
@article{BUT41222, author="Radek {Přikryl} and Ota {Salyk} and Lukáš {Křípal} and Vladimír {Čech}", title="New Scratch Tester Developed for Plasma Polymer Characterization", journal="Czechoslovak Journal of Physics", year="2002", volume="2002", number="52 D (2002)", pages="5", issn="0011-4626" }