Publication detail

Statistical Approach to Roughness-Induced Shielding Effects

POKLUDA, J. ŠANDERA, P. HORNÍKOVÁ, J.

Original Title

Statistical Approach to Roughness-Induced Shielding Effects

Type

journal article - other

Language

English

Original Abstract

A new theoretical concept is introduced to describe the roughness-induced shielding effects in metallic materials. This approach is based on the statistics of the local ratio between the characteristic microstuctural distance and the plastic zone size. A general equation involving both the crack branching and the crack closure phenomena is derived in the frame of linear elastic fracture mechanics under the assumption of remote mode I loading. It enablesthe determination of the intrinsic valuesof both the fracture toughness and the fatigue crack growth threshold. Moreover, the roughness-induced component can be separated from other closure components, such as the plasticity or oxide-induced closure. In order to estimate the total roughness-induced shileding effect only standard materials data such as the yield stress, the mean grain size, the surface roughness and the fracture mode are necessary. Examples of applications concerning static fracture and fatigue are presented for selected metallic materials.

Keywords

crack branching; crack closure; roughness-induced shielding; size ratio; statistical approach

Authors

POKLUDA, J. ŠANDERA, P. HORNÍKOVÁ, J.

RIV year

2004

Released

1. 3. 2004

Publisher

'Neuveden'

Location

'Neuveden'

ISBN

8756-758X

Periodical

Fatigue & Fracture of Engineering Materials & Structures

Year of study

27

Number

2

State

United Kingdom of Great Britain and Northern Ireland

Pages from

141

Pages to

157

Pages count

17

BibTex

@article{BUT42400,
  author="Jaroslav {Pokluda} and Pavel {Šandera} and Jana {Horníková}",
  title="Statistical Approach to Roughness-Induced Shielding Effects",
  journal="Fatigue & Fracture of Engineering Materials & Structures",
  year="2004",
  volume="27",
  number="2",
  pages="17",
  issn="8756-758X"
}