Publication detail

Artificial defects of solar cells

ŠKARVADA, P. TOMÁNEK, P. PALAI-DANY, T.

Original Title

Artificial defects of solar cells

Type

journal article - other

Language

English

Original Abstract

Artificial defects of solar cells are observable with laser beam induced current techniques. Reversed bias solar cell light emission can also reveal structure inhomogenity and local mechanical damage of the sample. The paper shows simple method for basic classification into structure group and artificial defects group. Observed artificial defects are shown and process of its creation is described. Defects classification method is based on the measurement of light emission at fixed reverse voltage while the temperature of sample is changing in the range of 20 K. There is different light emission temperature dependence in the case of bulk defects and mechanical damage defects. Experimental light emission data are consequently correlated with laser beam induced current map.

Keywords

solar cell, light emission, silicon, reverse biased

Authors

ŠKARVADA, P.; TOMÁNEK, P.; PALAI-DANY, T.

RIV year

2011

Released

27. 6. 2011

Publisher

ZČU

Location

Plzeň

ISBN

1802-4564

Periodical

ElectroScope - http://www.electroscope.zcu.cz

Year of study

2011

Number

2

State

Czech Republic

Pages from

33

Pages to

37

Pages count

5

BibTex

@article{BUT72917,
  author="Pavel {Škarvada} and Pavel {Tománek} and Tomáš {Palai-Dany}",
  title="Artificial defects of solar cells",
  journal="ElectroScope - http://www.electroscope.zcu.cz",
  year="2011",
  volume="2011",
  number="2",
  pages="33--37",
  issn="1802-4564"
}