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MAGAMEDOVA, E. BILALOV, B. SOBOLA, D.
Original Title
Panoramic analysis of surface of high-resistance materials by scanning probe microscopy
English Title
Type
conference paper
Language
Russian
Original Abstract
This study describes the panoramic analysis by scanning probe microscopy. It is shown that by analysis with consequent using of several methods and regimes it is possible to obtain reliable and consistent with theory data.
English abstract
Keywords
wide-band-gap semiconductor, probe, scanner, calibration
Key words in English
Authors
MAGAMEDOVA, E.; BILALOV, B.; SOBOLA, D.
Released
18. 5. 2010
Location
Mocsow
Pages from
113
Pages to
114
Pages count
2
BibTex
@inproceedings{BUT76502, author="Egana {Magamedova} and Bilal {Bilalov} and Dinara {Sobola}", title="Panoramic analysis of surface of high-resistance materials by scanning probe microscopy", booktitle="Education in nanotechnology field -modern decision and pespectives", year="2010", pages="113--114", address="Mocsow" }