Přístupnostní navigace
E-application
Search Search Close
Publication detail
FIALKA, J. BENEŠ, P.
Original Title
Comparison of Methods of Piezoelectric Coefficient Measurement
Type
conference paper
Language
English
Original Abstract
The paper compares the main methods used for measuring of the piezoelectric material constants. It outlines the principle of three measuring methods most commonly used today, i.e. the frequency method, the laser interferometry method and the quasi-static method. These methods have been practically applied to piezoelectric ceramic samples. The paper describes the production of the piezoelectric ceramic samples of defined sizes in accordance with the current regulations. An NCE51 production code soft ceramic was used in the experiments. A piezoelectric charge coefficient was measured. The final values of the piezoelectric charge coefficient obtained through all the methods were compared to the catalogue values of the piezoelectric ceramic. All three methods can be described as appropriate; compared with the frequency method, the laser interferometry and quasi-static methods are rather time-consuming and more demanding with respect to preparation of the measurement experiment. The frequency method provides results within a smaller value range.
Keywords
piezoelectric charge constant; frequency method; laser interferometry; quasi-static; PZT ceramics
Authors
FIALKA, J.; BENEŠ, P.
RIV year
2012
Released
13. 5. 2012
Publisher
IEEE Service Center
Location
445 Hoes Lane Piscataway, NJ 08855-1331 USA
ISBN
978-1-4577-1771-0
Book
2012 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2012) Proceedings
Edition
1
Edition number
Pages from
37
Pages to
42
Pages count
6
BibTex
@inproceedings{BUT92090, author="Jiří {Fialka} and Petr {Beneš}", title="Comparison of Methods of Piezoelectric Coefficient Measurement", booktitle="2012 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2012) Proceedings", year="2012", series="1", number="1", pages="37--42", publisher="IEEE Service Center", address="445 Hoes Lane Piscataway, NJ 08855-1331 USA", isbn="978-1-4577-1771-0" }