Publication detail

An Investigation of Noise, Nonlinearity, and Long-Term Stability of Thick-Film Resistors

BELAVIC, D., ROCAK, D., SEDLÁKOVÁ, V., HROVAT, M., ŠIKULA, J., PAVELKA, J.

Original Title

An Investigation of Noise, Nonlinearity, and Long-Term Stability of Thick-Film Resistors

Type

conference paper

Language

English

Original Abstract

In this paper we present an investigation of the long-term stability, the noise index (Quan-Tech Noise), and the nonlinearity iof small, thick-film resistors made with two high0ohmic (100 kOhm/sq. nominal sheet resistivity) thick-film resisotrs materials and terminated with two conductor materials (Ag/Pd and low-coist Ag). The results showed that the thick-film resistor paste 2051 has a better long-term stability and a lower current noise than the HS8049 resistor paste.

Key words in English

thick-film resistor, long-term stability, noise index, nonlinearity

Authors

BELAVIC, D., ROCAK, D., SEDLÁKOVÁ, V., HROVAT, M., ŠIKULA, J., PAVELKA, J.

RIV year

2003

Released

1. 1. 2003

Publisher

CNRL

Location

Brno

ISBN

80-238-9094-8

Book

Noise and Non-linearity Testing of Modern Electronic Components

Pages from

40

Pages to

43

Pages count

4

BibTex

@inproceedings{BUT9252,
  author="Darko {Belavic} and Dubravka {Rocak} and Vlasta {Sedláková} and Marko {Hrovat} and Josef {Šikula} and Jan {Pavelka}",
  title="An Investigation of Noise, Nonlinearity, and Long-Term Stability of Thick-Film Resistors",
  booktitle="Noise and Non-linearity Testing of Modern Electronic Components",
  year="2003",
  pages="4",
  publisher="CNRL",
  address="Brno",
  isbn="80-238-9094-8"
}