Publication detail

ABSOLUTE DISTANCE MEASUREMENTS WITH TUNABLE SEMICONDUCTOR LASER

MIKEL, B., ČÍP, O.

Original Title

ABSOLUTE DISTANCE MEASUREMENTS WITH TUNABLE SEMICONDUCTOR LASER

Type

conference paper

Language

English

Original Abstract

High-precise industrial distance measurements by means of laser interferometer with a single-frequency He-Ne laser are used very often. Main disadvantage of that method is necessity to travel with a measuring retroreflector of Michelson interferometer across the measurement distance. On the other hand a narrow linewidth, frequency stability and beam shape of He-Ne laser lead to an ultra-high resolution below 1 nm [1]. In contrast to this conventional interferometry, the other one based on a tunable laser source allows to detect distances in a static way without moving the reflector. In this case, the moving process is replaced by tuning of the wavelength of laser source at front of Michelson interferometer. Then the synthetic wavelength, which is limited by a continuous tunable range of the laser, determines the scale resolution of the absolute distance interferometer.

Keywords

Laser interferometry, semiconductor laser, temperature stability.

Authors

MIKEL, B., ČÍP, O.

RIV year

2003

Released

10. 10. 2003

Publisher

Formatex

Location

Španělsko

Pages from

979

Pages to

979

Pages count

1

BibTex

@inproceedings{BUT9275,
  author="Břetislav {Mikel} and Ondřej {Číp}",
  title="ABSOLUTE DISTANCE MEASUREMENTS WITH TUNABLE SEMICONDUCTOR LASER",
  booktitle="1st International Meeting on Applied Physics",
  year="2003",
  pages="1",
  publisher="Formatex",
  address="Španělsko"
}