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ŠICNER, J. MACKŮ, R. KOKTAVÝ, P.
Original Title
MICRO - SIZED LOCAL DEFECTS ON THE EDGE OF SILICON SOLAR CELLS AND THEIR OPTICAL AND THERMAL CHARACTERISTICS
Type
conference paper
Language
English
Original Abstract
This article deals with local defects (fractures) on edges of silicon solar cells. We observed a particular type of structural defects by an electron microscope. These defects can be regarded as surface texturization breaks. Specimens including this type of local defects have been put under investigation. We study weak radiation generated from reverse-biased defect active area by means of a photomultiplier and a scientific CCD camera. This approach proves to be useful to measure micro-scale surface imperfections and fractures. We also focused on thermal degradation in stressed regions. To this aim we used an infrared camera and it turns out that temperature degradation could affect larger regions compared to micro-scale defects.
Keywords
solar cell, local defect, fractured surface, CCD camera
Authors
ŠICNER, J.; MACKŮ, R.; KOKTAVÝ, P.
RIV year
2012
Released
11. 10. 2012
Publisher
Litera
Location
Brno
ISBN
978-80-214-4594-9
Book
New trends in physics Proceedings of the conference
Edition number
1
Pages from
73
Pages to
76
Pages count
4
BibTex
@inproceedings{BUT95958, author="Jiří {Šicner} and Robert {Macků} and Pavel {Koktavý}", title="MICRO - SIZED LOCAL DEFECTS ON THE EDGE OF SILICON SOLAR CELLS AND THEIR OPTICAL AND THERMAL CHARACTERISTICS", booktitle="New trends in physics Proceedings of the conference", year="2012", number="1", pages="73--76", publisher="Litera", address="Brno", isbn="978-80-214-4594-9" }