Publication detail

MICRO - SIZED LOCAL DEFECTS ON THE EDGE OF SILICON SOLAR CELLS AND THEIR OPTICAL AND THERMAL CHARACTERISTICS

ŠICNER, J. MACKŮ, R. KOKTAVÝ, P.

Original Title

MICRO - SIZED LOCAL DEFECTS ON THE EDGE OF SILICON SOLAR CELLS AND THEIR OPTICAL AND THERMAL CHARACTERISTICS

Type

conference paper

Language

English

Original Abstract

This article deals with local defects (fractures) on edges of silicon solar cells. We observed a particular type of structural defects by an electron microscope. These defects can be regarded as surface texturization breaks. Specimens including this type of local defects have been put under investigation. We study weak radiation generated from reverse-biased defect active area by means of a photomultiplier and a scientific CCD camera. This approach proves to be useful to measure micro-scale surface imperfections and fractures. We also focused on thermal degradation in stressed regions. To this aim we used an infrared camera and it turns out that temperature degradation could affect larger regions compared to micro-scale defects.

Keywords

solar cell, local defect, fractured surface, CCD camera

Authors

ŠICNER, J.; MACKŮ, R.; KOKTAVÝ, P.

RIV year

2012

Released

11. 10. 2012

Publisher

Litera

Location

Brno

ISBN

978-80-214-4594-9

Book

New trends in physics Proceedings of the conference

Edition number

1

Pages from

73

Pages to

76

Pages count

4

BibTex

@inproceedings{BUT95958,
  author="Jiří {Šicner} and Robert {Macků} and Pavel {Koktavý}",
  title="MICRO - SIZED LOCAL DEFECTS ON THE EDGE OF SILICON SOLAR CELLS AND THEIR OPTICAL AND THERMAL CHARACTERISTICS",
  booktitle="New trends in physics Proceedings of the conference",
  year="2012",
  number="1",
  pages="73--76",
  publisher="Litera",
  address="Brno",
  isbn="978-80-214-4594-9"
}