Course detail

Methods of Structure Analysis I

FSI-WA1Acad. year: 2010/2011

The coarse is concerned with:optical microscopy(methods,principles,applications),image analysis. Interaction between electrons and material. Transmission electron microscopy and diffraction. High-voltage TEM. High-resolution electron microscopy. Scanning electron microscopy. Environmental SEM. Microanalysis in electron microscopy (X-Ray microanalysis, Auger analysis, Electron energy-loss spectrometry). X-Ray diffractometry.

Language of instruction

Czech

Number of ECTS credits

5

Mode of study

Not applicable.

Guarantor

prof. Ing. Jiří Švejcar, CSc.

Department

Institute of Materials Science and Engineering (ÚMVI)

Learning outcomes of the course unit

Students will lern of the principles and application potentials of the basic methods for structural and phase analyses, inclusive of taking and preparing samples.

Prerequisites

The study of experimental methods employed in the analysis of the structure (morphology and phase composition) of materials requires the knowledge of physics and mathematics as provided in the course of BSc studies, and also the knowledge of materials sciences and materials engineering at least on the level of a graduate of the Bachelor´s degree of the mechanical engineering study.

Co-requisites

Not applicable.

Planned learning activities and teaching methods

Teaching methods depend on the type of course unit as specified in the article 7 of BUT Rules for Studies and Examinations.

Assesment methods and criteria linked to learning outcomes

Exam: written and oral parts. Awarding the course-unit credit is conditional on the elaboration of assigned sets of problems.

Course curriculum

Not applicable.

Work placements

Not applicable.

Aims

The course objective is to offer students an overview and, to a lesser extent, also the theoretical knowledge and principles of all basic methods for structural and phase analyses (physical principles of methods, instrument parameters, application scope of the methods, etc.), inclusive of sample preparation. Based on practical applications, students will have gained a basic overview of methodological procedures used in solving problems and analysing results.

Specification of controlled education, way of implementation and compensation for absences

Compulsory attendance at exercises. Absence from classes is dealt with individually, usually by make-up exercises.

Recommended optional programme components

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

GOLDSTEIN, I. Joseph. Scanning electron microscopy and X-ray microanalysis. 3rd ed. New York: Kluwer, 2003, xix, 689 s. : il. + 1 CD-ROM. ISBN 0-306-47292-9. (EN)

Recommended reading

FLEWITT, P. E. J a Robert K WILD. Physical methods for materials characterisation. Bristol: Institute of Physics Publishing, 1994, xvi, 517 p. : il. ISBN 0-7503-0320-4. (EN)

Classification of course in study plans

  • Programme N3901-2 Master's

    branch M-FIN , 1 year of study, summer semester, compulsory
    branch M-MTI , 1 year of study, summer semester, compulsory

Type of course unit

 

Lecture

39 hod., optionally

Teacher / Lecturer

prof. Ing. Jiří Švejcar, CSc.
Ing. Martin Petrenec, Ph.D.

Syllabus

1. Introduction to structural and phase analyses (imaging and analytical methods)
2. Optical microscopy (methods for increasing the phase contrast)
3. Quantitative evaluation of phases; hardness and microhardness
4. Introduction to electron microscopy
5. Structural factor, reciprocal lattice, electron diffraction
6. High-resolution microscopy, unconventional electron sources, diffraction by convergent beam of electrons
7. HV transmission electron microscopy, scanning electron microscopy
8. Environmental scanning electron microscopy, introduction to analytical methods
9. Energy and wave dispersive spectrometry (EDS and WDS)- general characteristics
10. Analysis based on electron energy loss spectrometry (EELS), further analytical potentials of electron microscopy
11. Problems involved in the application of EDS and WDS, ZAF correction, analysis of sub-micron volumes
12. Image analysis in optical and electron microscopy
13. Diffraction methods in transmission and scanning electron microscopy