Course detail

Methods of Structure Analysis II

FSI-WA2Acad. year: 2010/2011

The coarse is concerned with:special microscopic and diffraction methods,i.e.ALCHEMI, back-scattered diffraction in SEM, EXAFS, etc. Analytical methods for industrial purposes (X-Ray spectrometry, OES, AAS, AFS, i.e. methods based on emission, absorption and fluorescence of light. Selected physical methods (ESCA, SIMS, SIPS, methods based on acoustic emission, laser microscopy, etc). Scanning probe microscopy (STM, AFM, SNOM, etc).

Language of instruction

Czech

Number of ECTS credits

5

Mode of study

Not applicable.

Guarantor

prof. Ing. Jiří Švejcar, CSc.

Department

Institute of Materials Science and Engineering (ÚMVI)

Learning outcomes of the course unit

Students will have a general overview in selected areas and a more in-depth knowledge of the methods of studying structure, substructures, phase and chemical composition of materials.

Prerequisites

The study in this course requires the knowledge of basic experimental methods that are used in the study of the structure of engineering materials (in particular light and electron microscopy, and methods of local chemical analysis in electron microscopes). To understand the content of this course, the knowledge of mathematics, physics and materials sciences is inevitable, at least on the level of a of the Bachelor´s degree of mechanical engineering study.

Co-requisites

Not applicable.

Planned learning activities and teaching methods

Teaching methods depend on the type of course unit as specified in the article 7 of BUT Rules for Studies and Examinations.

Assesment methods and criteria linked to learning outcomes

The exam has a written and an oral part. Awarding the course-unit credit is conditional on submitting written reports on assigned topics.

Course curriculum

Not applicable.

Work placements

Not applicable.

Aims

The course objective is to make students familiar with the basic methods of structural and phase analyses, and broadens this knowledge to cover methods used in fundamental research as well as methods used in metallurgical analyses and engineering (spectroscopic methods). The objective is to prepare future materials specialists for a quick analysis of an optimum choice of the solving method of a given operation problem or solving problems of both fundamental and applied research.

Specification of controlled education, way of implementation and compensation for absences

Compulsory attendance at laboratory exercises and instruction visits. Absence from exercises is dealt with individually, usually by way of make-up assignment.

Recommended optional programme components

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

BRANDON, David a Wayne D KAPLAN. Microstructural characterization of materials. New York: John Wiley, 1999, 409 s. : il. ISBN 0-471-98501-5. (EN)
FLEWITT, P. E. J a Robert K WILD. Physical methods for materials characterisation. Bristol: Institute of Physics Publishing, 1994, xvi, 517 p. : il. ISBN 0-7503-0320-4.ProQuest Ebook Central (EN)
KLOUDA, Pavel. Moderní analytické metody. Třetí, upravené vydání. Ostrava: Pavel Klouda - nakladatelství Pavko, 2016, 176 stran : ilustrace ; 24 cm. ISBN 978-80-86369-22-8. (CS)

Recommended reading

Not applicable.

Classification of course in study plans

  • Programme N3901-2 Master's

    branch M-MTI , 2 year of study, winter semester, compulsory

Type of course unit

 

Lecture

26 hod., optionally

Teacher / Lecturer

prof. Ing. Jiří Švejcar, CSc.

Syllabus

1-2. Analytical electron microscopy.
3. Problems of analysing nanometric and sub-micrometric objects.
4. Scanning-probe microscopy (STM, AFM, SNOM, etc.).
5. Diffraction of back-scattered electrons in scanning electron microscope (EBSD - OIM).
6. Principles and application of selected microscopic and analytical methods I (ESCA, SIMS, SIPS, etc.).
7. Principles and application of selected microscopic and analytical methods II (microscopy using acoustic emission, laser, X-rays, etc., video-microscope, etc.).
8. Introduction to methods of fast spectral analysis for industrial application, radiospectroscopy.
9-10. An overview and distribution of instrumental analytical methods. Principles and application of methods of optical emission spectrometry (GDOES). New trends in OES.
11. Optical emission spectgrometry with induction-coupled plasma (OES-ICP),physical foundations, principle, application, new trends.
12. Atomic absorbtion spectrometry (AAS). Foundations, physical principles, instgrumentation and application.
13. Combustion analyzers of C, S, N, O and H.