English

Not applicable.

Students will receive a survey about problems connected with diagnostics of electrical materials and devices, about principles and organization of testing in Czech Rep. Students will be acquaint with tests which are obligatory at introducing a new electrical product to market. In practise they will be able to suggest a suitable diagnostic method for solving of a concrete diagnostic problem.

The subject knowledge on the secondary school level is required.

Not applicable.

Teaching methods depend on the type of course unit as specified in the article 7 of BUT Rules for Studies and Examinations.

Requirements for accreditation:
Active participation in seminars. Development, delivery and presentation of term paper.
Final written exam.

1) Fundamental concepts of technical diagnostics, survey of methods. Tecnical diagnostics in practise. Selection of a method of technical diagnostics.
2) Electrical measuring methods in diagnostics of semiconductor materials and structures. Methods for setting of concentration and concentration profiles of dopants.
3) DC and AC measuring methods in diagnostics of insulator systems. HV tests, evaluation of tests.
4) Safety tests of electrical devices. Climatic tests, mechanical tests of electrical devices and equipments.
5) Tests of mechanical properties - survey of methods. Hardness tests. Methods of acoustic and electromagnetic diagnostics.
6) Diagnostics and testing. Obligations of producers, importers and distributors at introducing of products to market. Conformity assesment of products.
7) Physical methods for setting of structure and composition of materials, material systems and structures. Methods based on scanning probe, secondary ion mass spectroscopy (SIMS). Sensitivity and resolution of methods.
8) Survey of methods of optical microscopy. Methods for measurement of thin layer thickness.
9) Scanning and transmission electron microscopy. Diagnostics on bases of detection of individual signals.
10) Special methods of scanning electron microscopy. Voltage contrast, magnetic contrast, EBIC, low energy and low vacuum electron microscopy.
11) Diffraction methods. X-ray diffraction, electron and neutron diffraction methods.
12) Spectroscopy methods, atom and molecule spectroscopy. Absorption, emission, X-ray and electron spectroscopy. Mass spectroscopy.
13) Evaluation of results of a measurement. Measurement errors, parameters of accuracy.

Not applicable.

The aim of the course is to acquaint students with basic concepts and methods from the field of diagnostic of electrical materials and devices, with principles and organization of testing stations in Czech Rep. Students will be familiar with electrical and mechanical tests, safety tests and tests of climatic resistance. Students will receive essential information about physical methods for evaluation of a structure and composition of observed subjects.

Obligatory participation in teaching.

Not applicable.

Not applicable.

Reimer,L.:Scanning electron microscopy,Springer Verlag Berlin,1999 (EN)

Eckertová,L., Frank,L.: Elektronová mikroskopie a difrakce, Academia Praha,1996. (CS)
Frank,L.,Král,J.: Metody analýzy povrchů. Iontové, sondové a speciální metody. Academia, Praha, 2002 (CS)
Jirák, J., Havlíček, S., Rozsívalová, Z.: Diagnostika a zkušebnictví. Elektronické texty, Brno 2002. (CS)
Koblížek,V. Měření a kontrola v elektrotechnologii ČVUT Praha,1991. (CS)