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FEKT-KDTSAcad. year: 2011/2012
Structure and the basics of the subject. Failures classification and failure mechanisms. Physical and functional methods of technical diagnostics. Diagnostics system. Diagnostics and testing of electronic circuits. The types of failures. Failures detection and localization. Diagnostics of logic and analogue circuits. Structural tests generation. Test equipments. Boundary scan, ASA testers, signature analyzers, logic analyzers. Design for testability and diagnostics. Diagnostics of microprocessors and microcomputers.
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Specification of controlled education, way of implementation and compensation for absences
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Classification of course in study plans
branch BK-EST , 2 year of study, summer semester, elective interdisciplinarybranch BK-MET , 2 year of study, summer semester, elective specialised
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Exercise in computer lab
Laboratory exercise