Course detail

Diagnostics of Nanostructures

FSI-TDNAcad. year: 2011/2012

The subject is aimed at the explanation of physical principles of diagnostics of 1D and 2D nanostructures suitable for a study of morphological and structural parameters, as well as of their local properties. The individual methods, fundamentals of their selection and optimization with respect with their lateral resolution will be described. In addition to scanning probe microscopic metods (STM, AFM, EFM, MFM, SNOM, etc.) and electron and ion microscopy (TEM, SEM, etc.) also optical microscopic spectroscopic techniques (e.g. confocal scanning Raman spectroscopy and photoluminiscence) and their combination will be discussed (STL, cathodoluminiscence, TERS, etc.). These methods will be demonstrated and tested as well.

Language of instruction

Czech

Number of ECTS credits

4

Mode of study

Not applicable.

Guarantor

doc. Ing. Radek Kalousek, Ph.D.

Department

Institute of Physical Engineering (ÚFI)

Learning outcomes of the course unit

Students will learn the current status of a new field called Diagnostics of Nanostructures which will also be of assistance to them for the selection of their diploma and doctoral theses.

Prerequisites

Elementary Physics, Quantum Physics, Solid State Physics, Surfaces and Thin Films.

Co-requisites

Not applicable.

Planned learning activities and teaching methods

Teaching methods depend on the type of course unit as specified in the article 7 of BUT Rules for Studies and Examinations.

Assesment methods and criteria linked to learning outcomes

The assessment of a student is made upon his performance in practice and quality of a discussion on topics selected at the colloquium (lecture notes allowed at preparation).

Course curriculum

Not applicable.

Work placements

Not applicable.

Aims

The goal is to give an overview of the methods providing the diagnostics of 1D and 0D nanostructures concerning both their morphological and structural characteristics and their local electronic, optical, electrical and magnetic properties as well.

Specification of controlled education, way of implementation and compensation for absences

The presence of students at practice is obligatory and is monitored by the tutor. The way how to compensate missed practice lessons will be determined by the tutor depending on the extent and content of the missed lessons.

Recommended optional programme components

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

Meyer E., Hug H. J.: Scanning Probe Microscopy, The Lab on a Tip, Springer , 2004.
Stroscio A., Keiser W. J.: Scanning Tunneling Microscopy, Academic Press, Inc., 1993.

Recommended reading

Not applicable.

Classification of course in study plans

  • Programme N3901-2 Master's

    branch M-FIN , 2 year of study, summer semester, compulsory-optional

Type of course unit

 

Lecture

13 hod., optionally

Teacher / Lecturer

doc. Ing. Radek Kalousek, Ph.D.

Syllabus

Introduction to Scanning Probe Microscopy (SPM); Scanning Tunneling Microscopy (STM) - principles of imaging by tunneling current and operation modes; scanning force microscopy (SFM) - relevant forces and operation modes; atomic force microscopy (AFM), magnetic force microscopy (MFM), electric force microscopy (EFM) and Kelvin force microscopy (KFM); scanning near field optical microscopy (SNOM); other types of SPM; principles of SPM design; electron and ion microscopy and spectroscopy (TEM/EELS, SEM/SAM,aj.); optical microscopy and spectroscopy (e.g. confocal scanning Raman spectroscopy and photoluminiscence); combined methods (STL, cathodoluminiscence, TERS, etc.).

Exercise

14 hod., compulsory

Teacher / Lecturer

doc. Ing. Radek Kalousek, Ph.D.

Syllabus

The calculation of supportive theoretical examples and practical demonstrations and testing take place during the whole semester.

Computer-assisted exercise

6 hod., compulsory

Teacher / Lecturer

doc. Ing. Radek Kalousek, Ph.D.

Syllabus

See seminars.