Course detail

Advanced Experimental Methods II

FSI-TSIAcad. year: 2012/2013

First option of the course is devoted to the basic and advanced optical measurement methods and their engineering applications.
The second option of the course is aimed at the experiments in the field of surface and thin film physics.

Language of instruction

Czech

Number of ECTS credits

Mode of study

Not applicable.

Guarantor

prof. RNDr. Radim Chmelík, Ph.D.

Department

Institute of Physical Engineering (ÚFI)

Learning outcomes of the course unit

In the first option, students acquire knowledge and skills necessary for designing of optical systems, measurements and observations.
The second option is intended to gain of practical skills in typical experimental techniques and procedures in the field of surface and thin film physics.
In both options of the course, students experience experimental work in a team, gain the competence to apply theoretical knowledge during the practical measurement and to present the results of their work in a written form.

Prerequisites

The knowledge of engineering and applied optics is expected for the first option of the course; the second option of the course requires the knowledge of the fundamental solid state physics and physical technologies.

Co-requisites

Not applicable.

Planned learning activities and teaching methods

Teaching methods depend on the type of course unit as specified in the article 7 of BUT Rules for Studies and Examinations.

Assesment methods and criteria linked to learning outcomes

Completion of the course is conditional on having attended all exercises according to the schedule and submitted all reports in at least sufficient quality. The course classification reflects the assessment of the reports, the quality of preparation and of laboratory works.

Course curriculum

Not applicable.

Work placements

Not applicable.

Aims

The goal of the first option of the course is to teach students the basic methods of the optical measurement including the measurement of optical elements and to familiarise students practically with the implementation and accuracy of interference, diffraction and microscopic methods.
The goal of the course in its second option is to familiarise students with the fundamentals and realisation of the basic measurements in the field of surface and thin film physics.

Specification of controlled education, way of implementation and compensation for absences

Completion of all exercises specified in the selected course option according to the instructions of the tutors is obligatory.

Recommended optional programme components

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

Eckertová, L.: Physics of Thin Films
Luth, H.: Surfaces and Interfaces of Solids
Reynolds, G. O., DeVelis, J. B., Parrent G. B., Thompson B. J.: The New Physical Optics Notebook

VUT

Faculties

University Institutes

Parts

Advanced Experimental Methods II