Course detail
Measurement Technique
FSI-XMT-KAcad. year: 2012/2013
The course introduces the students to the principles of computer-supported measurement systems. Possible errors in measurements performed by these systems, their corrections and methods of interpretation of the obtained data are explained.
Language of instruction
Czech
Number of ECTS credits
6
Mode of study
Not applicable.
Learning outcomes of the course unit
After the course, the students are able to design simple measurement systems made of standard components, for example for measurements of length, temperature, location etc., to evaluate the obtained data and to analyze the possible faults of the measurement chain.
Prerequisites
Students are expected to have basic knowledge of metrology, electrotechnics and PC skills.
Co-requisites
Not applicable.
Planned learning activities and teaching methods
Teaching methods depend on the type of course unit as specified in the article 7 of BUT Rules for Studies and Examinations.
Assesment methods and criteria linked to learning outcomes
Course-unit credit is conditioned by 100% attendance at laboratory practicals and approved reports. Examination has a written and an oral part and tests student’s knowledge and his/her ability to apply it in practice.
Course curriculum
Not applicable.
Work placements
Not applicable.
Aims
The objective of the course is to introduce the students to the computer-supported measurement systems.
Specification of controlled education, way of implementation and compensation for absences
Seminars are compulsory, attendance is monitored. Absence can be compensated on agreement with the teacher.
Recommended optional programme components
Not applicable.
Prerequisites and corequisites
Not applicable.
Basic literature
Bernstein: PC Messlabor. Franzis Verlag 1998 ISBN 3-7723-5733-4
Hofmann, D., Handbuch Messtechnik und Qualitatssicherung : Berlin : Verlag Technik 1986.
Hofmann: Priemyselná meracia technika. ALFA Bratislava 1988 ISBN 80-05-00139-8
Krsek,Osanna, Kuric, Prostrednik: Strojárska metrológia a riadenie kvality, STU Bratislava 2002 ISBN 80-227-1789-4
Profos, Pfeifer: Handbuch der industriellen Messtechnik. Oldenbourg München, 1994, ISBN 3-486-22592-8
Team authors, The Measurement, Instrumentation and Sensors Handbook : Boca Raton: CRC Press LLC, 1999.
Hofmann, D., Handbuch Messtechnik und Qualitatssicherung : Berlin : Verlag Technik 1986.
Hofmann: Priemyselná meracia technika. ALFA Bratislava 1988 ISBN 80-05-00139-8
Krsek,Osanna, Kuric, Prostrednik: Strojárska metrológia a riadenie kvality, STU Bratislava 2002 ISBN 80-227-1789-4
Profos, Pfeifer: Handbuch der industriellen Messtechnik. Oldenbourg München, 1994, ISBN 3-486-22592-8
Team authors, The Measurement, Instrumentation and Sensors Handbook : Boca Raton: CRC Press LLC, 1999.
Recommended reading
Daďo, S., Kreidl, M. Senzory a měřicí obvody : Praha : Vydavatelství ČVUT v Praze 1996.
Chudý, V., Palenčár, R., Kureková, E., Halaj, M., Meranie technických veličín : Bratislava : Vydavatelstvo STU v Bratislave 1999.
Jenčík, J., Volf, J. Technická měření : Praha : Vydavatelství ČVUT v Praze 2000.
Jenčík,J., Kuhn,L., Technická měření ve strojnictví :Praha : SNTL 1982.
Sládek, Z., Vdoleček, F., Technická měření : Brno : Nakladatelství VUT v Brně 1992.
Chudý, V., Palenčár, R., Kureková, E., Halaj, M., Meranie technických veličín : Bratislava : Vydavatelstvo STU v Bratislave 1999.
Jenčík, J., Volf, J. Technická měření : Praha : Vydavatelství ČVUT v Praze 2000.
Jenčík,J., Kuhn,L., Technická měření ve strojnictví :Praha : SNTL 1982.
Sládek, Z., Vdoleček, F., Technická měření : Brno : Nakladatelství VUT v Brně 1992.
Classification of course in study plans
Type of course unit
Guided consultation
9 hod., optionally
Teacher / Lecturer
Syllabus
1. Principle of computer-aided measuring system
2. Typical analog and digital sensors
3. Principle of A/D and D/A converter, mistakes of conversion
4. Sampling, mistakes in sampling, filter
5. Graphical systems for on-line processing of measured data (LabView)
6. Analysis of the obtained data (statistical processing)
7. Analysis of the obtained data (frequency analysis, digital filtration)
8. Possible measuring mistakes in computer-aided measuring systems
9. Measuring mistakes and their corrections
10. Structures of measuring systems
11. Measuring systems properties
12. FMEA analysis - a tool for identification of potential mistakes in the measurement chain
13. Principle of tunnel scanning microscope and microscope of atomic forces
2. Typical analog and digital sensors
3. Principle of A/D and D/A converter, mistakes of conversion
4. Sampling, mistakes in sampling, filter
5. Graphical systems for on-line processing of measured data (LabView)
6. Analysis of the obtained data (statistical processing)
7. Analysis of the obtained data (frequency analysis, digital filtration)
8. Possible measuring mistakes in computer-aided measuring systems
9. Measuring mistakes and their corrections
10. Structures of measuring systems
11. Measuring systems properties
12. FMEA analysis - a tool for identification of potential mistakes in the measurement chain
13. Principle of tunnel scanning microscope and microscope of atomic forces
Laboratory exercise
9 hod., compulsory
Teacher / Lecturer
Syllabus
1. Measurement of positioning accuracy I (laserinterferometr, ballbar,...)
2. Measurement of positioning accuracy II (laserinterferometr, ballbar,...)
3. Measurement of positioning accuracy III (laserinterferometr, ballbar,...)
4. Measurement of positioning accuracy IV (laserinterferometr, ballbar,...)
5. Measurement of geometrical accuracy I (coordinate measuring machine)
6. Measurement of geometrical accuracy II (coordinate measuring machine)
7. Measurement of geometrical accuracy III (coordinate measuring machine)
8. Measurement of geometrical accuracy IV (coordinate measuring machine)
9. Measurement of dynamic processes I (vibration sensors, high-speed camera,...)
10. Measurement of dynamic processes II (vibration sensors, high-speed camera,...)
11. Measurement of dynamic processes III (vibration sensors, high-speed camera,...)
12. Measurement of dynamic processes IV (vibration sensors, high-speed camera,...)
13. Presentation of special measurements, handout of measurement protocols, credit
2. Measurement of positioning accuracy II (laserinterferometr, ballbar,...)
3. Measurement of positioning accuracy III (laserinterferometr, ballbar,...)
4. Measurement of positioning accuracy IV (laserinterferometr, ballbar,...)
5. Measurement of geometrical accuracy I (coordinate measuring machine)
6. Measurement of geometrical accuracy II (coordinate measuring machine)
7. Measurement of geometrical accuracy III (coordinate measuring machine)
8. Measurement of geometrical accuracy IV (coordinate measuring machine)
9. Measurement of dynamic processes I (vibration sensors, high-speed camera,...)
10. Measurement of dynamic processes II (vibration sensors, high-speed camera,...)
11. Measurement of dynamic processes III (vibration sensors, high-speed camera,...)
12. Measurement of dynamic processes IV (vibration sensors, high-speed camera,...)
13. Presentation of special measurements, handout of measurement protocols, credit