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FEKT-NDMEAcad. year: 2013/2014
Organization of testing in Czech Rep. and EU. Diagnostic methods for evaluation of properties and parameters of electroinsulating materials and systems. Diagnostic methods for evaluation of properties of semiconductor wafers and structures, of contamination and defects in semiconductor materials. Diagnostic methods based on exploitation of electron beam for evaluation of structure and composition of materials.Theory of evaluation of measured data.
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Specification of controlled education, way of implementation and compensation for absences
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branch MN-EVM , 2 year of study, winter semester, compulsory
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Exercise in computer lab
Laboratory exercise