Course detail

Diagnostics and measurements of functional properties of nanostructures

CEITEC VUT-DS102Acad. year: 2013/2014

Not applicable.

Language of instruction

Czech

Mode of study

Not applicable.

Guarantor

prof. RNDr. Tomáš Šikola, CSc.

Department

Central European Institute of Technology BUT (CEITEC VUT)

Learning outcomes of the course unit

Not applicable.

Prerequisites

Not applicable.

Co-requisites

Not applicable.

Planned learning activities and teaching methods

Not applicable.

Assesment methods and criteria linked to learning outcomes

Not applicable.

Course curriculum

Not applicable.

Work placements

Not applicable.

Aims

Not applicable.

Specification of controlled education, way of implementation and compensation for absences

Not applicable.

Recommended optional programme components

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

Meyer E., Hug H. J.: Scanning Probe Microscopy, The Lab on a Tip, Springer , 2004 (EN)
Novotny L. and Hecht B.:Principles of Nano-Optics, Cambridge University Press, 2006 (EN)
Stroscio A., Keiser W. J.: Scanning Tunneling Microscopy, Academic Press, Inc., 1993 (EN)

Recommended reading

Not applicable.

Classification of course in study plans

  • Programme STIAMN Doctoral

    branch PNTMT , 1 year of study, summer semester, compulsory-optional
    branch PNTMT , 2 year of study, summer semester, compulsory-optional